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3.3.25. NXinstrumentΒΆ


base class, extends NXobject, version 1.0


Template of instrument descriptions comprising various beamline components. Each component will also be a NeXus group defined by its distance from the sample. Negative distances represent beamline components that are before the sample while positive distances represent components that are after the sample. This device allows the unique identification of beamline components in a way that is valid for both reactor and pulsed instrumentation.


No symbol table
Groups cited:
NXaperture, NXattenuator, NXbeam_stop, NXbeam, NXbending_magnet, NXcapillary, NXcollection, NXcollimator, NXcrystal, NXdetector_group, NXdetector, NXdisk_chopper, NXevent_data, NXfermi_chopper, NXfilter, NXflipper, NXguide, NXinsertion_device, NXmirror, NXmoderator, NXmonochromator, NXpolarizer, NXpositioner, NXsource, NXvelocity_selector, NXxraylens


name: NX_CHAR

Name of instrument

@short_name: NX_CHAR

short name for instrument, perhaps the acronym

(aperture): NXaperture

(attenuator): NXattenuator

(beam): NXbeam

(beam_stop): NXbeam_stop

(bending_magnet): NXbending_magnet

(collimator): NXcollimator

(collection): NXcollection

(capillary): NXcapillary

(crystal): NXcrystal

(detector): NXdetector

(detector_group): NXdetector_group

(disk_chopper): NXdisk_chopper

(event_data): NXevent_data

(fermi_chopper): NXfermi_chopper

(filter): NXfilter

(flipper): NXflipper

(guide): NXguide

(insertion_device): NXinsertion_device

(mirror): NXmirror

(moderator): NXmoderator

(monochromator): NXmonochromator

(polarizer): NXpolarizer

(positioner): NXpositioner

(source): NXsource

(velocity_selector): NXvelocity_selector

(xraylens): NXxraylens

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